Measurement of the Dopant Concentration in a Semiconductor Using the Seebeck Effect

AuthID
 P-00H-PMA
6
Author(s)
Pó, JM
·
Brito, MC
·
Vallêra, AM
Document Type
Article
Year published
2013
Published
in Measurement Science and Technology - Meas. Sci. Technol., ISSN: 0957-0233
Volume: 24, Issue: 5, Pages: 055601
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ISSN: 0957-0233
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