Process Fault Diagnosis Approach Based on Neural Observers

AuthID
 P-000-5NK
3
Author(s)
2
Editor(s)
LoBello, L; Sauter, T
Document Type
Proceedings Paper
Year published
2005
Published
in ETFA 2005: 10th IEEE International Conference on Emerging Technologies and Factory Automation, Vol 1, Pts 1 and 2, Proceedings
Volume: 1 2 VOLS, Pages: 1057-1060 (4)
Conference
10Th Ieee International Conference on Emerging Technologies and Factory Automation, Date: SEP 19-22, 2005, Location: Catania, ITALY, Sponsors: Univ Studi Catania, IEEE Ind Elect Soc, Iconics, Schneider, ST Microelect, Medianet Comunicaz SrL
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Scopus®
Publication Identifiers
Scopus: 2-s2.0-33847313767
Wos: WOS:000238575500148
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