Fault Detection and Isolation of Industrial Processes Using Optimized Fuzzy Models

AuthID
P-000-5S3
3
Author(s)
2
Editor(s)
Krishnapuram, R; Pal, N
Document Type
Proceedings Paper
Year published
2005
Published
in FUZZ-IEEE 2005: PROCEEDINGS OF THE IEEE INTERNATIONAL CONFERENCE ON FUZZY SYSTEMS: BIGGEST LITTLE CONFERENCE IN THE WORLD in IEEE International Conference on Fuzzy Systems, ISSN: 1098-7584
Pages: 851-856 (6)
Conference
Ieee International Conference on Fuzzy Systems, Date: MAY 22-25, 2005, Location: Reno, NV, Sponsors: IEEE, IEEE Neural Networks Soc
Indexing
Publication Identifiers
Scopus: 2-s2.0-23944482709
Wos: WOS:000230981000147
Source Identifiers
ISSN: 1098-7584
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