A Framework to Calibrate the Scanning Electron Microscope Under Variational Magnifications

AuthID
P-00K-KPE
5
Author(s)
Liu, XJ
·
Li, ZW
·
Zhong, K
·
Shi, YS
Document Type
Article
Year published
2016
Published
in IEEE PHOTONICS TECHNOLOGY LETTERS, ISSN: 1041-1135
Volume: 28, Issue: 16, Pages: 1715-1718 (4)
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Publication Identifiers
Scopus: 2-s2.0-84976595452
Wos: WOS:000379881200001
Source Identifiers
ISSN: 1041-1135
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