Fault Diagnosis in Highly Dependable Medical Wearable Systems

AuthID
 P-00K-P1N
2
Author(s)
Document Type
Article
Year published
2016
Published
in JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, ISSN: 0923-8174
Volume: 32, Issue: 4, Pages: 467-479 (13)
Conference
20Th Ieee International Mixed-Signal Testing Workshop (Imstw), Date: JUN 24-26, 2015, Location: Paris, FRANCE, Sponsors: IEEE, IEEE Comp Soc, TTTC, CNRS, Grenoble INP, Univ Joseph Fourier
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Wos®
Scopus®
Crossref®6
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-84979230953
Wos: WOS:000381976800008
Source Identifiers
ISSN: 0923-8174
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