Fpga Redundancy Recovery Based on Partial Bitstreams for Multiple Partitions

AuthID
 P-00K-QAZ
4
Author(s)
Reis, JG
·
Bezerra, EA
Document Type
Proceedings Paper
Year published
2015
Published
in 2015 16TH LATIN-AMERICAN TEST SYMPOSIUM (LATS)
Conference
16Th Ieee Latin American Test Symposium (Lats), Date: MAR 25-27, 2015, Location: Puerto Vallarta, MEXICO, Sponsors: IEEE, Natl Inst Astrophys Opt Electron, Test Technol Techn Council, IEEE Council Electron Design Automat
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Wos®
Publication Identifiers
Wos: WOS:000380400700020
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