An Equivalent Doping Profile for Cmos Substrate Characterization

AuthID
 P-002-1TG
3
Author(s)
Document Type
Article
Year published
2013
Published
in SOLID-STATE ELECTRONICS, ISSN: 0038-1101
Volume: 79, Pages: 185-191 (7)
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Wos®
Scopus®
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Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-84869501698
Wos: WOS:000313611000035
Source Identifiers
ISSN: 0038-1101
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