Publications

A Methodological Framework Using Statistical Tests for Comparing Machine Learning Based Models Applied to Fault Diagnosis in Rotating Machinery

AuthID
P-00M-QWX

Author(s)

Pacheco, F

Cerrada, M

Sánchez, RV

Cabrera, D

Li, C

De Oliveira, JV

Editor(s)

Rodriguez,C;Gomez,JB

Document Type

Proceedings Paper

Year published

2017

Published

in 2016 IEEE Latin American Conference on Computational Intelligence, LA-CCI 2016 - Proceedings

Conference

2016 Ieee Latin American Conference on Computational Intelligence, La-Cci 2016, Date: 2 November 2016 through 4 November 2016, Sponsors: IEEE Computational Intelligence Society (CIS);Institute of Electrical and Electronics Engineers (IEEE);Institute of Electrical and Electronics Engineers (IEEE) - Colombia Section

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