Efficient and Robust Test Generation-Based Timing Analysis

AuthID
 P-00M-WDK
2
Author(s)
Sakallah, KaremA.
Document Type
Proceedings Paper
Year published
1994
Published
in 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30 - June 2, 1994
Pages: 303-306
Indexing
Dblp®/en/publications/view/684467
Publication Identifiers
Dblp: conf/iscas/SilvaS94
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