Correntropy Applied to Fault Detection in Analogue Circuits

AuthID
P-00M-Z8B
1
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Document Type
Proceedings Paper
Year published
2017
Published
in Proceedings of the 2017 IEEE 22nd International Mixed-Signals Test Workshop, IMSTW 2017
Conference
22Nd Ieee International Mixed-Signals Test Workshop, Imstw 2017, Date: 3 July 2017 through 5 July 2017, Sponsors: IEEE Council on Electronics Design Automation (CEDA)
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Scopus: 2-s2.0-85028559077
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