Publications

AuthID
P-00N-1WD

Author(s)

Editor(s)

Beyerer, J; Leon, FP

Document Type

Proceedings Paper

Year published

2017

Published

in AUTOMATED VISUAL INSPECTION AND MACHINE VISION II in Proceedings of SPIE, ISSN: 0277-786X

Volume: 10334

Conference

Conference on Automated Visual Inspection and Machine Vision Ii, Date: JUN 29, 2017, Location: Munich, GERMANY, Sponsors: SPIE

Indexing

Wos^®

Scopus^®

Google Scholar^®

Publication Identifiers

DOI: 10.1117/12.2269606

Scopus: 2-s2.0-85029650553

Wos: WOS:000411753100006

Source Identifiers

ISSN: 0277-786X

Export Publication Metadata

Marked List

Info

At this moment we don't have any links to full text documens.

Useful Links