Efficient Yield Optimization Method Using a Variable K-Means Algorithm for Analog Ic Sizing

AuthID
 P-00N-88H
5
Author(s)
Document Type
Proceedings Paper
Year published
2017
Published
in Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
Pages: 1201-1206
Conference
20Th Design, Automation and Test in Europe, Date 2017, Date: 27 March 2017 through 31 March 2017, Sponsors: ACM Special Interest Group on Design Automation (ACM SIGDA);Electronic System Design Alliance (ESDA);et al.;European Design and Automation Association (EDAA);European Electronic Chips and Systems Design Initiative (ECSI);IEEE Council on Electronic Design Automation (CEDA)
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Scopus: 2-s2.0-85020206846
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