Threshold Voltage Extraction Techniques Adaptable from Sub-Micron Cmos to Large-Area Oxide Tft Technologies

AuthID
 P-00N-BBW
5
Author(s)
Samanta, S
·
Tiwari, B
·
Document Type
Article
Year published
2017
Published
in INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, ISSN: 0098-9886
Volume: 45, Issue: 12, Pages: 2201-2210 (10)
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Publication Identifiers
Wos: WOS:000418158100019
Source Identifiers
ISSN: 0098-9886
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