Evidence for Chemical and Electronic Nonuniformities in the Formation of the Interface of Rbf-Treated Cu(In,Ga)Se-2 with Cds

AuthID
 P-00N-FK6
9
Author(s)
Nicoara, N
·
Kunze, T
·
Duarte, RF
·
Wilks, RG
·
Witte, W
·
Baer, M
·
Sadewasser, S
Document Type
Article
Year published
2017
Published
in ACS APPLIED MATERIALS & INTERFACES, ISSN: 1944-8244
Volume: 9, Issue: 50, Pages: 44173-44180 (8)
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Publication Identifiers
Wos: WOS:000418783700087
Source Identifiers
ISSN: 1944-8244
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