Derivation of the Near-Surface Dielectric Function of Amorphous Silicon from Photoelectron Loss Spectra

AuthID
 P-002-5RX
7
Author(s)
David, D
·
Godet, C
·
Sabbah, H
·
Solal, F
·
·
Document Type
Article
Year published
2012
Published
in JOURNAL OF NON-CRYSTALLINE SOLIDS, ISSN: 0022-3093
Volume: 358, Issue: 17, Pages: 2019-2022 (4)
Conference
24Th International Conference on Amorphous and Nanocrystalline Semiconductors (Icans), Date: AUG 21-26, 2011, Location: Nara, JAPAN, Sponsors: Japan Soc Promot Sci, 147th Comm Amorphous & Nanocrystalline Mat, Commemorat Org Japan World Expositi, Osaka Univ Global COE Program Core Res & Engn Adv Mat Interdisciplinary Educ Ctr Mat Sci, Asahi Glass Fdn, ALS Tech Co Ltd, Crev Inc, Coherent Inc, DAIHEN Corp, Dainippon Screen Co Ltd, HOYA Corp, J A Woollam Co Inc, Kaneka Corp, KEYENCE Corp, Mitsubishi Heavy Ind Ltd, Nano Photon, Nisshin Steel Co Ltd, Samco Inc, Sanyo Elect Co Ltd, Semicond Energy Lab Co Ltd, Shimadzu Corp, SNK Corp, Tokyo Elect Ltd, TOYO Corp, ULVAC Inc
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Publication Identifiers
Scopus: 2-s2.0-84865782220
Wos: WOS:000310394700021
Source Identifiers
ISSN: 0022-3093
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