On-Chip Built-In Self-Test of Video-Rate Adcs Using a 1.5 Vcmos Gaussian Noise Generator

AuthID
P-000-70N
3
Author(s)
Document Type
Proceedings Paper
Year published
2005
Published
in 2005 IEEE CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS, PROCEEDINGS in IEEE Conference on Electron Devices and Solid-State Circuits
Pages: 669-672 (4)
Conference
Ieee Conference on Electron Devices and Solid-State Circuits, Date: DEC 19-21, 2005, Location: Kowloon, PEOPLES R CHINA, Sponsors: IEEE Electron Devices Soc, IEEE Solid State Circuits Soc, IEEE Hong Kong Sect, KC Wong Educ Fdn, Solomon Systech Ltd
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Wos: WOS:000245210600147
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