On-Chip Built-In Self-Test of Video-Rate Adcs Using Gaussian Noise

AuthID
 P-000-71B
3
Author(s)
Document Type
Proceedings Paper
Year published
2005
Published
in 2005 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), VOLS 1-6, CONFERENCE PROCEEDINGS in IEEE International Symposium on Circuits and Systems, ISSN: 0271-4302
Pages: 796-799 (4)
Conference
Ieee International Symposium on Circuits and Systems (Iscas), Date: MAY 23-26, 2005, Location: Kobe, JAPAN, Sponsors: IEEE Circuits & Syst Soc, Sci Council Japan, Inst Elect, Informat & Commun Engineers, Inst Elect Engineers Japan, Informat Proc Soc Japan
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Publication Identifiers
Scopus: 2-s2.0-39749149536
Wos: WOS:000232002400200
Source Identifiers
ISSN: 0271-4302
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