Optimised Filters for Texture Defect Detection

AuthID
P-000-73N
1
Author(s)
Document Type
Proceedings Paper
Year published
2005
Published
in 2005 International Conference on Image Processing (ICIP), Vols 1-5 in IEEE International Conference on Image Processing (ICIP), ISSN: 1522-4880
Volume: 3, Pages: 3165-3168 (4)
Conference
Ieee International Conference on Image Processing (Icip 2005), Date: SEP 11-14, 2005, Location: Genoa, ITALY, Sponsors: IEEE
Indexing
Publication Identifiers
Scopus: 2-s2.0-33749253358
Wos: WOS:000235773304016
Source Identifiers
ISSN: 1522-4880
Export Publication Metadata
Marked List
Info
At this moment we don't have any links to full text documens.