Pulsed I/V and S-Parameters Measurement System for Isodynamic Characterization of Power Gan Hemt Transistors

AuthID
 P-00P-M4G
4
Author(s)
Goncalves, CF
·
Document Type
Article
Year published
2018
Published
in INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING, ISSN: 1096-4290
Volume: 28, Issue: 8
Indexing
Wos®
Scopus®
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-85053262417
Wos: WOS:000444953200020
Source Identifiers
ISSN: 1096-4290
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service