Live Demonstration: An Automated Test Bench for an 130Nm Sc Dc-Dc Converter

AuthID
P-00P-Z8E
4
Author(s)
Madeira, R
·
Correia, N
·
Document Type
Proceedings Paper
Year published
2018
Published
in 2018 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS) in IEEE International Symposium on Circuits and Systems, ISSN: 0271-4302
Conference
Ieee International Symposium on Circuits and Systems (Iscas), Date: MAY 27-30, 2018, Location: Florence, ITALY, Sponsors: IEEE, Politecnico Torino, Analog Devices, CADENCE, Texas Instruments, AiCTX, Springer Nat, River Publishers, Nat Electron, CAS
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Publication Identifiers
Wos: WOS:000451218704090
Source Identifiers
ISSN: 0271-4302
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