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Cluster Secondary Ion Emission of Silicon: An Influence of the Samples' Dimensional Features
AuthID
P-00Q-4BG
11
Author(s)
Tolstogouzov, A
·
Drozdov, MN
·
Belykh, SF
·
Gololobov, GP
·
Ieshkin, AE
·
Mazarov, P
·
Suvorov, DV
·
Fu, DJ
·
Pelenovich, V
·
Zeng, XM
·
Zuo, WB
Document Type
Letter
Year published
2019
Published
in
RAPID COMMUNICATIONS IN MASS SPECTROMETRY,
ISSN: 0951-4198
Volume: 33, Issue: 3, Pages: 323-325 (3)
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Metadata
Sources
Publication Identifiers
DOI
:
10.1002/rcm.8345
Wos
: WOS:000456172800009
Source Identifiers
ISSN
: 0951-4198
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