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Electron and Hole Trapping in Eu- or Eu,Hf-Doped Lupo4 and Ypo4 Tracked by Epr and Tsl Spectroscopy
AuthID
P-00R-3XF
6
Author(s)
Laguta, V
·
Buryi, M
·
Nikl, M
·
Zeler, J
·
Zych, E
·
Bettinelli, M
Document Type
Article
Year published
2019
Published
in
JOURNAL OF MATERIALS CHEMISTRY C,
ISSN: 2050-7526
Volume: 7, Issue: 37, Pages: 11473-11482 (10)
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Publication Identifiers
DOI
:
10.1039/c9tc03507a
Scopus
: 2-s2.0-85072699615
Wos
: WOS:000487941000008
Source Identifiers
ISSN
: 2050-7526
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