An Upgraded Tof-Sims Vg Ionex Ix23Ls: Study on the Negative Secondary Ion Emission of Iii-V Compound Semiconductors with Prior Neutral Cesium Deposition

AuthID
 P-002-DX6
5
Author(s)
Document Type
Article
Year published
2012
Published
in APPLIED SURFACE SCIENCE, ISSN: 0169-4332
Volume: 258, Issue: 7, Pages: 2490-2497 (8)
Indexing
Wos®
Scopus®
Crossref®13
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-84855541822
Wos: WOS:000299162300045
Source Identifiers
ISSN: 0169-4332
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service