Metallic Filamentary Conduction in Valence Change-Based Resistive Switching Devices: the Case of Taox Thin Film with X Similar to 1

AuthID
 P-00R-E2X
12
Author(s)
Schoenhals, A
·
Menzel, S
·
Meledin, A
·
Mayer, J
·
Wuttig, M
·
Waser, R
·
Wouters, DJ
Document Type
Article
Year published
2019
Published
in NANOSCALE, ISSN: 2040-3364
Volume: 11, Issue: 36, Pages: 16978-16990 (13)
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Publication Identifiers
Wos: WOS:000496763600029
Source Identifiers
ISSN: 2040-3364
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