Development of Early Process Control Indicators for Reliability Drop Test Performance of Ewlb Products

AuthID
 P-002-F3F
5
Author(s)
Azevedo, A
·
Cardoso, A
·
Teixeira, J
·
Marques, R
Document Type
Proceedings Paper
Year published
2012
Published
in 2012 IEEE 62ND ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC), ISSN: 0569-5503
Pages: 776-780 (5)
Conference
62Nd Ieee Electronic Components and Technology Conference (Ectc), Date: MAY 29-JUN 01, 2012, Location: San Diego, CA, Sponsors: IEEE, IEEE Components, Packaging & Mfg Technol Soc (CPMT)
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Publication Identifiers
Scopus: 2-s2.0-84866846170
Wos: WOS:000309162000124
Source Identifiers
ISSN: 0569-5503
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