Locating and Imaging Impact Damage with an Integrated System of Pzt and Eddy Current Probe

AuthID
P-00S-T30
4
Author(s)
Feng, B
·
Pasadas, DJ
·
Ribeiro, AL
·
Document Type
Proceedings Paper
Year published
2019
Published
in 2019 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Pages: 142-147 (6)
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 20-23, 2019, Location: Auckland, NEW ZEALAND, Sponsors: IEEE, IEEE Instrumentat & Measurement Soc, Auckland Bioengineering Inst, Natl Instruments, RF Test Solut & ADLINK, Measurement Stand Lab New Zealand
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Publication Identifiers
Wos: WOS:000568630900028
Source Identifiers
ISSN: 1091-5281
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