The Impact of Long-Term Memory Effects on the Linearizability of Gan Hemt-Based Power Amplifiers

AuthID
 P-00W-627
7
Author(s)
Cooman, A
·
de Jong, AEF
·
Heeres, RM
·
Document Type
Article
Year published
2022
Published
in IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, ISSN: 0018-9480
Volume: 70, Issue: 2, Pages: 1377-1390 (14)
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Publication Identifiers
Wos: WOS:000753493000042
Source Identifiers
ISSN: 0018-9480
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