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Definition of Common Test Conditions for the New Jpeg Pleno Holography Standard

AuthID
P-00W-SXX

Author(s)

Pinheiro, AMG

Prazeres, J

Gilles, A

Muhammad, RK

Birnbaum, T

Schelkens, P

Editor(s)

Schelkens,P;Kozacki,T

Document Type

Proceedings Paper

Year published

2022

Published

in OPTICS, PHOTONICS AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS VII in Proceedings of SPIE, ISSN: 0277-786X

Volume: 12138

Conference

Proceedings Of Spie Optics, Photonics and Digital Technologies for Imaging Applications Vii, Date: APR 06-MAY 15, 2022, Location: EOS, Strasbourg, FRANCE, Host: EOS

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Wos^®

Scopus^®

Google Scholar^®

Metadata
Sources

Publication Identifiers

DOI: 10.1117/12.2624499

Scopus: 2-s2.0-85133023456

Wos: WOS:000943943400022

Source Identifiers

ISSN: 0277-786X

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Definition of Common Test Conditions for the New Jpeg Pleno Holography Standard

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