Mixed-Signal Fault Equivalence: Search and Evaluation

AuthID
P-002-WTN
2
Author(s)
Document Type
Proceedings Paper
Year published
2011
Published
in 2011 20TH ASIAN TEST SYMPOSIUM (ATS) in Asian Test Symposium Proceedings, ISSN: 1081-7735
Pages: 377-382 (6)
Conference
20Th Asian Test Symposium (Ats), Date: NOV 20-23, 2011, Location: New Delhi, INDIA, Sponsors: IEEE Comp Soc, Indraprastha Inst Informat Technol (IIIT), VLSI Soc
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Publication Identifiers
Scopus: 2-s2.0-84856181523
Wos: WOS:000300830400060
Source Identifiers
ISSN: 1081-7735
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