Handheld Instrument to Detect Defects in Conductive Plates with a Planar Probe

AuthID
 P-002-X16
3
Author(s)
Document Type
Proceedings Paper
Year published
2011
Published
in 2011 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE (I2MTC) in IEEE Instrumentation and Measurement Technology Conference, ISSN: 1091-5281
Pages: 144-149 (6)
Conference
Ieee International Instrumentation and Measurement Technology Conference (I2Mtc), Date: MAY 10-12, 2011, Location: Hangzhou, PEOPLES R CHINA, Sponsors: IEEE, IEEE Instrumentat & Measurement Soc, Zhejiang Univ
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Publication Identifiers
Scopus: 2-s2.0-80051869727
Wos: WOS:000297171900030
Source Identifiers
ISSN: 1091-5281
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