Effectiveness on C Flaws Checking and Removal

AuthID
P-00X-34Z
2
Author(s)
Inacio, J
·
Document Type
Proceedings Paper
Year published
2022
Published
in 52ND ANNUAL IEEE/IFIP INTERNATIONAL CONFERENCE ON DEPENDABLE SYSTEMS AND NETWORKS SUPPLEMENTAL VOLUME (DSN-S 2022)
Pages: 33-34 (2)
Conference
52Nd Annual Ieee/Ifip International Conference on Dependable Systems and Networks (Dsn), Date: JUN 27-30, 2022, Location: Baltimore, MD, Sponsors: IEEE,IFIP,IEEE Comp Soc,Siemens,Johns Hopkins Univ,KAUST,Intel,Lancaster Univ
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Scopus: 2-s2.0-85136132637
Wos: WOS:000853335500011
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