Ultrasound Interferometry for the Evaluation of Thickness and Adhesion of Thin Layers

AuthID
 P-002-XF5
2
Author(s)
Document Type
Article
Year published
2011
Published
in INTERNATIONAL JOURNAL OF MATERIALS & PRODUCT TECHNOLOGY, ISSN: 0268-1900
Volume: 41, Issue: 1-4, Pages: 153-161 (9)
Indexing
Wos®
Scopus®
Crossref®1
Google Scholar®
Publication Identifiers
Scopus: 2-s2.0-79957666692
Wos: WOS:000292408600013
Source Identifiers
ISSN: 0268-1900
Export Publication Metadata
Marked List
 Add to Marked List
Info
At this moment we don't have any links to full text documens.

A place for researchers and their institutions

Useful Links

Get Help

© 2024 CRACS & Inesc TEC - All Rights Reserved Privacy Policy | Terms of Service