Cttb Memory Test Board Single Event Effect Geostationary In-Flight Data Analysis

AuthID
 P-00X-7PQ
8
Author(s)
Sousa, T
·
Poivey, C
·
Bounasser, S
Document Type
Proceedings Paper
Year published
2022
Published
in 2020 20TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS 2020)
Pages: 165-170 (6)
Conference
20Th European Conference on Radiation and Its Effects on Components and Systems (Radecs), Date: JUN 19-23, 2020, Location: ELECTR NETWORK, Sponsors: IEEE,IEEE Nucl & Plasma Sci Soc,Nano Elec,Seibersdorf Labs,Tests & Radiat,3D Plus,Cobham,Renesas,RADECS Assoc
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Publication Identifiers
Scopus: 2-s2.0-85137992902
Wos: WOS:000861424900033
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