Combining X-Ray Real and Reciprocal Space Mapping Techniques to Explore the Epitaxial Growth of Semiconductors

AuthID
P-00Y-D2Q
9
Author(s)
Cabaco, JS
·
Concepcion, O
·
Buca, D
·
Stachowicz, M
·
Document Type
Article
Year published
2023
Published
in JOURNAL OF PHYSICS D-APPLIED PHYSICS, ISSN: 0022-3727
Volume: 56, Issue: 24
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Publication Identifiers
Wos: WOS:000970634100001
Source Identifiers
ISSN: 0022-3727
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