171
TÍTULO: Effect of UV and visible light radiation on the electrical performances of transparent TFTs based on amorphous indium zinc oxide  Full Text
AUTORES: Barquinha, P ; Pimentel, A ; Marques, A; Pereira, L ; Martins, R ; Fortunato, E ;
PUBLICAÇÃO: 2006, FONTE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, NÚMERO: 9-20
INDEXADO EM: Scopus WOS CrossRef
172
TÍTULO: Electrical performances of low temperature annealed hafnium oxide deposited at room temperature
AUTORES: Pereira, L ; Barquinha, P ; Fortunato, E ; Martins, R ;
PUBLICAÇÃO: 2006, FONTE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, NÚMERO: PART 1
INDEXADO EM: Scopus WOS
173
TÍTULO: Electron transport and optical characteristics in amorphous indium zinc oxide films  Full Text
AUTORES: Martins, R ; Almeida, P ; Barquinha, P ; Pereira, L ; Pimentel, A ; Ferreira, I ; Fortunato, E ;
PUBLICAÇÃO: 2006, FONTE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, NÚMERO: 9-20
INDEXADO EM: Scopus WOS CrossRef
174
TÍTULO: Impedance study of the electrical properties of poly-Si thin film transistors  Full Text
AUTORES: Pereira, L ; Raniero, L; Barquinha, P ; Fortunato, E ; Martins, R ;
PUBLICAÇÃO: 2006, FONTE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, NÚMERO: 9-20
INDEXADO EM: Scopus WOS CrossRef
175
TÍTULO: Influence of the semiconductor thickness on the electrical properties of transparent TFTs based on indium zinc oxide  Full Text
AUTORES: Barquinha, P ; Pimentel, A ; Marques, A; Pereira, L ; Martins, R ; Fortunato, E ;
PUBLICAÇÃO: 2006, FONTE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, NÚMERO: 9-20
INDEXADO EM: Scopus WOS CrossRef
176
TÍTULO: Influence of time, light and temperature on the electrical properties of zinc oxide TFTs  Full Text
AUTORES: Barquinha, P ; Fortunato, E ; Goncalves, A; Pimentel, A ; Marques, A; Pereira, L ; Martins, R ;
PUBLICAÇÃO: 2006, FONTE: Symposium on ZnO and Related Materials held at the 2005 Spring Meeting of the European-Materials-Research-Society in SUPERLATTICES AND MICROSTRUCTURES, VOLUME: 39, NÚMERO: 1-4
INDEXADO EM: Scopus WOS CrossRef: 29
177
TÍTULO: Investigation of a-Si : H 1D MIS position sensitive detectors for application in 3D sensors  Full Text
AUTORES: Aguas, H ; Pereira, L ; Raniero, L; Costa, D; Fortunato, E ; Martins, R ;
PUBLICAÇÃO: 2006, FONTE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, NÚMERO: 9-20
INDEXADO EM: Scopus WOS
178
TÍTULO: Investigation of a-Si:H 1D MIS position sensitive detectors for application in 3D sensors  Full Text
AUTORES: Águas, H; Pereira, L ; Raniero, L; Costa, D; Fortunato, E ; Martins, R;
PUBLICAÇÃO: 2006, FONTE: Journal of Non-Crystalline Solids, VOLUME: 352, NÚMERO: 9-20
INDEXADO EM: CrossRef
179
TÍTULO: Low temperature processed hafnium oxide: Structural and electrical properties  Full Text
AUTORES: Pereira, L ; Barquinha, P ; Fortunato, E ; Martins, R ;
PUBLICAÇÃO: 2006, FONTE: Symposium on Characterization of High-K Dielectric Materials held at the 2006 E-MRS Spring Meeting in MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, VOLUME: 9, NÚMERO: 6
INDEXADO EM: Scopus WOS CrossRef
180
TÍTULO: Multicomponent wide band gap oxide semiconductors for thin film transistors
AUTORES: Fortunato, E ; Barquinha, P ; Pereira, L ; Goncalves, G; Martins, R ;
PUBLICAÇÃO: 2006, FONTE: 6th International Meeting on Information Displays/5th International Display Manufacturing Conference (IMID/IDMC 2006) in IMID/IDMC 2006: THE 6TH INTERNATIONAL MEETING ON INFORMATION DISPLAY/THE 5TH INTERNATIONAL DISPLAY MANUFACTURING CONFERENCE, DIGEST OF TECHNICAL PAPERS, VOLUME: 2006
INDEXADO EM: Scopus WOS
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