Maria de Fatima Guimaraes Cerqueira


AuthID: R-000-B1C

Confirmed Publications: 40



31
TITLE: Dielectric function of nanocrystalline silicon with few nanometers (< 3 nm) grain size  Full Text
AUTHORS: Losurdo, M; Giangregorio, MM; Capezzuto, P; Bruno, G; Cerqueira, MF ; Alves, E ; Stepikhova, M;
PUBLISHED: 2003, SOURCE: APPLIED PHYSICS LETTERS, VOLUME: 82, ISSUE: 18
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
32
TITLE: Influence of crystals distribution on the photoluminescence properties of nanocrystalline silicon thin films  Full Text
AUTHORS: Cerqueira, MF ; Stepikhova, M; Losurdo, M; Giangregorio, MM; Alves, E ; Monteiro, T ; Soares, MJ ; Boemare, C;
PUBLISHED: 2003, SOURCE: Conference on Low Dimensional Structures and Devices (LDSD) in MICROELECTRONICS JOURNAL, VOLUME: 34, ISSUE: 5-8
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
33
TITLE: Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films  Full Text
AUTHORS: Losurdo, M; Cerqueira, MF ; Alves, E ; Stepikhova, MV; Giangregorio, MM; Bruno, G;
PUBLISHED: 2003, SOURCE: Spring Meeting of the European-Materials-Research-Society (E-MRS) in PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, VOLUME: 16, ISSUE: 3-4
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
34
TITLE: Laser modulated optical reflectance of thin semiconductor films on glass  Full Text
AUTHORS: Fotsing, JLN; Hoffmeyer, M; Chotikaprakhan, S; Dietzel, D; Pelzl, J; Bein, BK; Cerqueira, F ; Macedo, F ; Ferreira, JA;
PUBLISHED: 2003, SOURCE: 12th International Conference on Photoacoustic and Photothermal Phenomena (12 ICPPP) in REVIEW OF SCIENTIFIC INSTRUMENTS, VOLUME: 74, ISSUE: 1
INDEXED IN: Scopus WOS CrossRef
IN MY: ORCID
35
TITLE: The structure and photoluminescence of erbium-doped nanocrystalline silicon thin films produced by reactive magnetron sputtering
AUTHORS: Cerqueira, MF ; Losurdo, M; Stepikhova, MV; Conde, O ; Giangregorio, MM; Pinto, P; Ferreira, JA;
PUBLISHED: 2002, SOURCE: 9th International Autumn Meeting on Gettering and Defect Engineering in Semiconductor Technology (GADEST 2001) in GETTERING AND DEFECT ENGINEERING IN SEMICONDUCTOR TECHNOLOGY, VOLUME: 82-84
INDEXED IN: Scopus WOS
IN MY: ORCID
36
TITLE: Spectroscopic ellipsometry study of the layer structure and impurity content in Er-doped nanocrystalline silicon thin films  Full Text
AUTHORS: Losurdo, M; Cerqueira, MF ; Stepikhova, MV; Alves, E ; Giangregorio, MM; Pinto, P; Ferreira, JA;
PUBLISHED: 2001, SOURCE: 21st International Conference on Defects in Semiconductors in PHYSICA B-CONDENSED MATTER, VOLUME: 308
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID
37
38
TITLE: Optical modulation spectroscopy of hydrogenated microcrystalline silicon  Full Text
AUTHORS: Cerqueira, MF ; Jansen, J; Adriaenssens, GJ; Ferreira, JA;
PUBLISHED: 1997, SOURCE: Symposium B: Thin Film Materials for Large Area Electronics at the European-Materials-Research-Society 1996 Spring Meeting in THIN SOLID FILMS, VOLUME: 296, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef: 3
IN MY: ORCID
39
TITLE: Photoluminescence and structure properties from mu c-Si:H and mu c-Si:H-PS samples  Full Text
AUTHORS: Ventura, PJ; Cerqueira, MF ; Carmo, MC; Ferreira, JA;
PUBLISHED: 1997, SOURCE: Symposium B: Thin Film Materials for Large Area Electronics at the European-Materials-Research-Society 1996 Spring Meeting in THIN SOLID FILMS, VOLUME: 296, ISSUE: 1-2
INDEXED IN: Scopus WOS CrossRef: 1
IN MY: ORCID
40
TITLE: OPTICALLY-ACTIVE TRANSITION-METAL DEFECTS IN SILICON
AUTHORS: CARMO, MCD; NAZARE, MH; THOMAZ, MF; CALAO, I; CERQUEIRA, F ; DAVIES, G;
PUBLISHED: 1989, SOURCE: SYMP ON THE CHARACTERIZATION OF THE STRUCTURE AND CHEMISTRY OF DEFECTS IN MATERIALS in CHARACTERIZATION OF THE STRUCTURE AND CHEMISTRY OF DEFECTS IN MATERIALS, VOLUME: 138
INDEXED IN: WOS
Página 4 de 4. Total de resultados: 40.

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