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175

TÃTULO: Mn-doped ZnO nanocrystals embedded in Al2O3: structural and electrical properties
AUTORES: Khodorov, A ; Levichev, S ; Rolo, AG ; Karzazi, O; Chahboun, A ; Novak, J; Vorobiev, A; Tavares, CJ ; Eyidi, D; Riviere, JP; Beaufort, MF; Barradas, NP ; Alves, E ; Barber, DJ; Lanceros Mendez, S ; Gomes, MJM ;
PUBLICAÇÃO: 2010, FONTE: NANOTECHNOLOGY, VOLUME: 21, NÚMERO: 50

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176

TÃTULO: Multilayers of Ge nanocrystals embedded in Al2O3 matrix: Structural and electrical studies Full Text
AUTORES: Pinto, SRC; Rolo, AG ; Chahboun, A ; Maja Buljan; Khodorov, A ; Kashtiban, RJ; Bangert, U; Barradas, NP ; Alves, E ; Bernstorff, S; Gomes, MJM ;
PUBLICAÇÃO: 2010, FONTE: MICROELECTRONIC ENGINEERING, VOLUME: 87, NÚMERO: 12

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177

TÃTULO: N-Doped Photocatalytic Titania Thin Films on Active Polymer Substrates
AUTORES: Tavares, CJ ; Marques, SM; Lanceros Mendez, S ; Rebouta, L ; Alves, E ; Barradas, NP ; Munnik, F; Girardeau, T; P Riviere;
PUBLICAÇÃO: 2010, FONTE: International Conference on Surface, Coatings and Nanostructured Materials in JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, VOLUME: 10, NÚMERO: 2

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178

TÃTULO: Stopping power of B-11 in Si and TiO2 measured with a bulk sample method and Bayesian inference data analysis Full Text
AUTORES: Siketic, Z; Bogdanovic B Radovic; Alves, E ; Barradas, NP ;
PUBLICAÇÃO: 2010, FONTE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 11-12

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179

TÃTULO: Structural study of Si1-xGex nanocrystals embedded in SiO2 films
AUTORES: Pinto, SRC; Kashtiban, RJ; Rolo, AG ; Buljan, M; Chahboun, A ; Bangert, U; Barradas, NP ; Alves, E ; Gomes, MJM ;
PUBLICAÇÃO: 2010, FONTE: Symposium on Silicon and Germanium Issues for Future CMOS Devices held at the 2009 E-MRS Spring Meeting in THIN SOLID FILMS, VOLUME: 518, NÚMERO: 9

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180

TÃTULO: Thin film depth profiling using simultaneous particle backscattering and nuclear resonance profiling Full Text
AUTORES: Barradas, NP ; Mateus, R ; Fonseca, M. ; Miguel A. Reis ; Lorenz, K ; Vickridge, I;
PUBLICAÇÃO: 2010, FONTE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 11-12

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