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273

TÃTULO: Continuous stopping power curves of Al2O3 for 0.2-2.5 MeV He ions Full Text
AUTORES: Pascual Izarra, C; Bianconi, M; Barradas, NP ; Climent Font, A; Garcia, G; Gonzalo, J; Afonso, C;
PUBLICAÇÃO: 2004, FONTE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, NÚMERO: 1-4

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274

TÃTULO: Double scattering in grazing angle Rutherford backscattering spectra Full Text
AUTORES: Barradas, NP ;
PUBLICAÇÃO: 2004, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 225, NÚMERO: 3

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275

TÃTULO: Exchange bias of MnPt/CoFe films prepared by ion beam deposition Full Text
AUTORES: Rickart, M; Freitas, PP ; Trindade, IG ; Barradas, NP ; Alves, E ; Salgueiro, M ; Muga, N ; Ventura, J ; Sousa, JB ; Proudfoot, G; Pearson, D; Davis, M;
PUBLICAÇÃO: 2004, FONTE: JOURNAL OF APPLIED PHYSICS, VOLUME: 95, NÚMERO: 11

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276

TÃTULO: Formation of AlxGa1-xSb films over GaSb substrates by Al diffusion
AUTORES: Ruiz, CM; Barradas, NP ; Alves, E ; Plaza, JL; Bermudez, V; Dieguez, E;
PUBLICAÇÃO: 2004, FONTE: 10th International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (DRIP 10) in EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, VOLUME: 27, NÚMERO: 1-3

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277

TÃTULO: He-RBS, He-ERDA and heavy ion-ERDA analysis of Si/Ta 70 Å/CoFe 35 Å/HfAlOx/CoFe 35 Å/Ta 30 Å systems Full Text
AUTORES: Barradas, NP ; Matias, V; Sequeira, AD; Soares, JC ; Kreissig, U; Wang, JU; Freitas, PP ;
PUBLICAÇÃO: 2004, FONTE: Proceedings of the Sixteenth International Conference on Ion in Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 219-220, NÚMERO: 1-4

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278

TÃTULO: He-RBS, He-ERDA and heavy ion-ERDA analysis of Si/Ta 70A/CoFe 35 A/HfAlOx/CoFe 35 A/Ta 30 A systems Full Text
AUTORES: Barradas, NP ; Matias, V; Sequelra, AD; Soares, JC ; Kreissig, U; Wang, JU; Freltas, PP ;
PUBLICAÇÃO: 2004, FONTE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219

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279

TÃTULO: Ion beam analysis of TiN/Ti multilayers deposited by magnetron sputtering Full Text
AUTORES: Andrade, E; Flores, M; Muhl, S; Barradas, NP ; Murillo, G; Zavala, EP; Rocha, MF;
PUBLICAÇÃO: 2004, FONTE: 16th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 219, NÚMERO: 1-4

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280

TÃTULO: Ion beam studies of TiNxOy thin films deposited by reactive magnetron sputtering Full Text
AUTORES: Alves, E ; Ramos, AR ; Barradas, NP ; Vaz, F ; Cerqueira, P; Rebouta, L ; Kreissig, U;
PUBLICAÇÃO: 2004, FONTE: Symposium on Protective Coatings and Thin Films held at the E-MRS 20th Spring Meeting in SURFACE & COATINGS TECHNOLOGY, VOLUME: 180

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