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322

TÃTULO: Accurate depth profiling of complex optical coatings Full Text
AUTORES: Jeynes, C; Barradas, NP ; Rafla Yuan, H; Hichwa, BP; Close, R;
PUBLICAÇÃO: 2000, FONTE: 8th European Conference on Applications of Surface and Interface Analysis in SURFACE AND INTERFACE ANALYSIS, VOLUME: 30, NÚMERO: 1

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323

TÃTULO: Artificial neural network algorithm for analysis of Rutherford backscattering data
AUTORES: Barradas, NP ; Vieira, A;
PUBLICAÇÃO: 2000, FONTE: PHYSICAL REVIEW E, VOLUME: 62, NÚMERO: 4

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324

TÃTULO: Composition of Ni-Ta-C thick films using simulated annealing analysis of elastic backscattering spectrometry data Full Text
AUTORES: Jeynes, C; Barradas, NP ; Wilde, JR; Greer, AL;
PUBLICAÇÃO: 2000, FONTE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161

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325

TÃTULO: Growth and characterisation of amorphous carbon films doped with nitrogen Full Text
AUTORES: Barradas, NP ; Khan, RUA; Anguita, JV; Silva, SRP; Kreissig, U; Grotzschel, R; Moller, W;
PUBLICAÇÃO: 2000, FONTE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161

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326

TÃTULO: Instrumentation amplifiers and voltage controlled current sources for LHC cryogenic instrumentation
AUTORES: Agapito, JA; Barradas, NP ; Cardeira, FM; Casas, J; Fernandes, AP; Franco, FJ; Gomes, P; Goncalves, IC; Cachero, AH; Lozano, J; Martin, MA; Marques, JG; Paz, A; Prata, MJ; Ramalho, AJG; Ruiz, MAR; Santos, JP; Vieira, A;
PUBLICAÇÃO: 2000, FONTE: 6th Workshop on Electronics for LHC Experiments in PROCEEDINGS OF THE SIXTH WORKSHOP ON ELECTRONICS FOR LHC EXPERIMENTS, VOLUME: 2000, NÚMERO: 10

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327

TÃTULO: Magnetoresistance enhancement in specular, bottom-pinned, Mn83Ir17 spin valves with nano-oxide layers Full Text
AUTORES: Veloso, A; Freitas, PP ; Wei, P; Barradas, NP ; Soares, JC ; Almeida, B ; Sousa, JB ;
PUBLICAÇÃO: 2000, FONTE: APPLIED PHYSICS LETTERS, VOLUME: 77, NÚMERO: 7

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328

TÃTULO: Neural network analysis of Rutherford backscattering data Full Text
AUTORES: Vieira, A; Barradas, NP ;
PUBLICAÇÃO: 2000, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 170, NÚMERO: 1-2

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329

TÃTULO: Simultaneous and consistent analysis of NRA, RES and ERDA data with the IBA DataFurnace Full Text
AUTORES: Barradas, NP ; Parascandola, S; Sealy, BJ; Grotzschel, R; Kreissig, U;
PUBLICAÇÃO: 2000, FONTE: 14th International Conference on Ion Beam Analysis/6th European Conference on Accelerators in Applied Research and Technology in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 161

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330

TÃTULO: Bayesian error analysis of Rutherford backscattering spectra Full Text
AUTORES: Barradas, NP ; Jeynes, C; Jenkin, M; Marriott, PK;
PUBLICAÇÃO: 1999, FONTE: 14th International Vacuum Congress/10th International Conference on Solid Surfaces/5th International Conference on Nanometre-Scale Science and Technology/10th International Conference on Quantitative Surface Analysis in THIN SOLID FILMS, VOLUME: 343, NÚMERO: 1-2

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