ProfileOfResearchers

352

TÃTULO: High depth resolution Rutherford backscattering analysis of Si-Si0.78Ge0.22/(0 0 1)Si superlattices Full Text
AUTORES: Barradas, NP ; Jeynes, C; Mironov, OA; Phillips, PJ; Parker, EHC;
PUBLICAÇÃO: 1998, FONTE: 5th European Conference on Accelerators in Applied Research and Technology (ECAART5) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 139, NÚMERO: 1-4

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353

TÃTULO: High precision Rutherford backscattering characterisation of 3-D objects implanted by plasma immersion ion implantation Full Text
AUTORES: Barradas, NP ;
PUBLICAÇÃO: 1998, FONTE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136

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354

TÃTULO: Improved ion beam analysis facilities at the University of Surrey Full Text
AUTORES: Jeynes, C; Barradas, NP ; Blewett, MJ; Webb, RP;
PUBLICAÇÃO: 1998, FONTE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136

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355

TÃTULO: RBS/simulated annealing analysis of buried SiCOx layers formed by implantation of O into cubic silicon carbide Full Text
AUTORES: Barradas, NP ; Jeynes, C; Jackson, SM;
PUBLICAÇÃO: 1998, FONTE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136

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356

TÃTULO: RBS/simulated annealing analysis of iron-cobalt silicides Full Text
AUTORES: Barradas, NP ; Jeynes, C; Harry, MA;
PUBLICAÇÃO: 1998, FONTE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136

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357

TÃTULO: RBS/simulated annealing analysis of silicide formation in Fe/Si systems Full Text
AUTORES: Barradas, NP ; Jeynes, C; Homewood, KP; Sealy, BJ; Milosavljevic, M;
PUBLICAÇÃO: 1998, FONTE: 5th European Conference on Accelerators in Applied Research and Technology (ECAART5) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 139, NÚMERO: 1-4

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358

TÃTULO: Residual post anneal damage of Ge and C co-implantation of Si determined by quantitative RBS-channelling Full Text
AUTORES: Nejim, A; Barradas, NP ; Jeynes, C; Cristiano, F; Wendler, E; Gartner, K; Sealy, BJ;
PUBLICAÇÃO: 1998, FONTE: 5th European Conference on Accelerators in Applied Research and Technology (ECAART5) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 139, NÚMERO: 1-4

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359

TÃTULO: The RBS data furnace: Simulated annealing Full Text
AUTORES: Barradas, NP ; Marriott, PK; Jeynes, C; Webb, RP;
PUBLICAÇÃO: 1998, FONTE: 13th International Conference on Ion Beam Analysis (IBA-13) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 136

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