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362

TÃTULO: Comparison of measured and calculated dose for plasma source ion implantation into 3-D objects Full Text
AUTORES: Mandl, S; Barradas, NP ; Brutscher, J; Gunzel, R; Moller, W;
PUBLICAÇÃO: 1997, FONTE: 10th International Conference on Ion Beam Modification of Materials (IBMM-96) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 127

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363

TÃTULO: Formation of ternary (Fe1-xCox)Si-2 structures by ion beam assisted deposition and ion implantation Full Text
AUTORES: Wieser, E; Panknin, D; Barradas, NP ; Betzl, M; Reuther, H; Henrion, W; Lange, H;
PUBLICAÇÃO: 1997, FONTE: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 124, NÚMERO: 4

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364

TÃTULO: Influence of the ion irradiation on the properties of beta-FeSi2 layers prepared by ion beam assisted deposition Full Text
AUTORES: Barradas, NP ; Panknin, D; Wieser, E; Schmidt, B; Betzl, M; Mucklich, A; Skorupa, W;
PUBLICAÇÃO: 1997, FONTE: 10th International Conference on Ion Beam Modification of Materials (IBMM-96) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 127

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365

TÃTULO: Short pulse plasma immersion ion implantation of oxygen into silicon: determination of the energy distribution Full Text
AUTORES: Barradas, NP ; Maas, AJH; Mandl, S; Gunzel, R;
PUBLICAÇÃO: 1997, FONTE: 3rd International Workshop on Plasma-Based Ion Implantation in SURFACE & COATINGS TECHNOLOGY, VOLUME: 93, NÚMERO: 2-3

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366

TÃTULO: Simulated annealing analysis of Rutherford backscattering data Full Text
AUTORES: Barradas, NP ; Jeynes, C; Webb, RP;
PUBLICAÇÃO: 1997, FONTE: APPLIED PHYSICS LETTERS, VOLUME: 71, NÚMERO: 2

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367

TÃTULO: Structural and optical characterisation of undoped Si-Si0.78Ge0.22/Si(001) superlattices grown by MBE Full Text
AUTORES: Mironov, OA; Phillips, PJ; Parker, EHC; Dowsett, MG; Barradas, NP ; Jeynes, C; Mironov, M; Gnezdilov, VP; Ushakov, V; Eremenko, VV;
PUBLICAÇÃO: 1997, FONTE: Workshop on Molecular Beam Expitaxy-Growth Physics and Technology (MBE-GPT 96) in THIN SOLID FILMS, VOLUME: 306, NÚMERO: 2

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368

TÃTULO: Study of lattice stress in Re/Co thin films and superlattices with the perturbed angular correlations technique Full Text
AUTORES: Barradas, NP ;
PUBLICAÇÃO: 1997, FONTE: THIN SOLID FILMS, VOLUME: 295, NÚMERO: 1-2

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369

TÃTULO: The composition and bonding structure of CN(x) films and their influence on the mechanical properties Full Text
AUTORES: Chowdhury, AKMS; Monclus, M; Cameron, DC; Gilvarry, J; Murphy, MJ; Barradas, NP ; Hashmi, MSJ;
PUBLICAÇÃO: 1997, FONTE: 24th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 97) in THIN SOLID FILMS, VOLUME: 308, NÚMERO: 1-4

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370

TÃTULO: Rutherford backscattering study of thin oxide layers prepared by reactive magnetron sputtering Full Text
AUTORES: Barradas, NP ; Soares, JC ; daSilva, MF; Plaskett, TS; Freitas, PP ;
PUBLICAÇÃO: 1996, FONTE: 12th International Conference on Ion Beam Analysis (IBA-12) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 118, NÚMERO: 1-4

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