81
TÍTULO: Developments of low-cost procedure to estimate cloud base height based on a digital camera  Full Text
AUTORES: Fernando M Janeiro ; Pedro M Ramos ; Frank Wagner; Silva, AM ;
PUBLICAÇÃO: 2010, FONTE: 19th IMEKO World Congress in MEASUREMENT, VOLUME: 43, NÚMERO: 5
INDEXADO EM: Scopus WOS CrossRef
82
TÍTULO: Frequency domain parameter estimation of two common frequency single-tone signals  Full Text
AUTORES: Tomas Radil; Pedro M Ramos ;
PUBLICAÇÃO: 2010, FONTE: MEASUREMENT, VOLUME: 43, NÚMERO: 9
INDEXADO EM: Scopus WOS CrossRef
83
TÍTULO: Impedance measuring system based on a dsPIC
AUTORES: Santos, J; Ramos, PM ;
PUBLICAÇÃO: 2010, FONTE: 17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements in 17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
INDEXADO EM: Scopus
84
TÍTULO: Impedance Spectroscopy of a Vibrating Wire for Viscosity Measurements  Full Text
AUTORES: Janeiro, FM ; Ramos, PM ; Fareleira, JMNA ; Diogo, JCF; Maximo, DRC; Caetano, FJP ;
PUBLICAÇÃO: 2010, FONTE: International Instrumentation and Measurement Technology Conference (I2MTC) in 2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXADO EM: Scopus WOS CrossRef Handle
85
TÍTULO: Improvement of Phase Difference Estimation Using Modified Ellipse Fit Method  Full Text
AUTORES: Zeeshan. A Awan; Pedro M Ramos ;
PUBLICAÇÃO: 2010, FONTE: International Instrumentation and Measurement Technology Conference (I2MTC) in 2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXADO EM: Scopus WOS CrossRef
86
TÍTULO: Low-cost mechanically steered millimeter-wave lens antenna system for indoor LANs
AUTORES: Fernandes, CA ; Martins, RC ; Radil, T; Ramos, PM ; Lima, EB; Medeiros, CR; Jorge R. Costa ;
PUBLICAÇÃO: 2010, FONTE: 2010 International Workshop on Antenna Technology: Small Antennas, Innovative Structures and Materials, iWAT2010 in Final Program and Book of Abstracts - iWAT 2010: 2010 International Workshop on Antenna Technology: Small Antennas, Innovative Structures and Materials
INDEXADO EM: Scopus CrossRef: 2
87
TÍTULO: Power Quality Detection and Classification Method for IEC 61000-4-30 Class A Instruments  Full Text
AUTORES: Tomas Radil; Pedro M Ramos ;
PUBLICAÇÃO: 2010, FONTE: International Instrumentation and Measurement Technology Conference (I2MTC) in 2010 IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE I2MTC 2010, PROCEEDINGS
INDEXADO EM: Scopus WOS CrossRef
88
TÍTULO: Sine-fitting algorithms implemented in 32-bit floating point systems
AUTORES: Ramos, PM ; Radil, T; Janeiro, FM ;
PUBLICAÇÃO: 2010, FONTE: 17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements in 17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
INDEXADO EM: Scopus
89
TÍTULO: Uncertainty analysis of a cloud base height measurement system based on digital photography
AUTORES: Janeiro, FM ; Wagner, F; Ramos, PM ; Silva, AM ;
PUBLICAÇÃO: 2010, FONTE: 17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements in 17th Symposium IMEKO TC4 - Measurement of Electrical Quantities, 15th International Workshop on ADC Modelling and Testing, and 3rd Symposium IMEKO TC19 - Environmental Measurements
INDEXADO EM: Scopus
90
TÍTULO: Application of Genetic Algorithms for Estimation of Impedance Parameters of Two-Terminal Networks  Full Text
AUTORES: Fernando M Janeiro ; Pedro M Ramos ;
PUBLICAÇÃO: 2009, FONTE: 26th IEEE International Instrumentation and Measurement Technology Conference in I2MTC: 2009 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3
INDEXADO EM: Scopus WOS CrossRef
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