ProfileOfResearchers

161

TÃTULO: Preliminary budget methodology for reverse engineering applications using laser scanning
AUTORES: Albarran, T; Lopes, L; Cabeca, J; Martins, RF ; Mourao, AJF ;
PUBLICAÇÃO: 2007, FONTE: 3rd International Conference on Advanced Research in Virtual and Rapid Prototyping: Virtual and Rapid Manufacturing Advanced Research Virtual and Rapid Prototyping in Proceedings of the 3rd International Conference on Advanced Research in Virtual and Rapid Prototyping: Virtual and Rapid Manufacturing Advanced Research Virtual and Rapid Prototyping

INDEXADO EM:

Scopus

NO MEU:

ORCID

162

TÃTULO: Preliminary studies on molybdenum-doped indium oxide thin films deposited by radio-frequency magnetron sputtering at room temperature Full Text
AUTORES: Elangovan, E; Marques, A; Fernandes, FMB ; Martins, R ; Fortunato, E ;
PUBLICAÇÃO: 2007, FONTE: THIN SOLID FILMS, VOLUME: 515, NÚMERO: 13

INDEXADO EM:

Scopus

WOS

CrossRef

NO MEU:

ORCID |

ResearcherID

163

TÃTULO: Role of order and disorder in covalent semiconductors and ionic oxides used to produce thin film transistors Full Text
AUTORES: Martins, R ; Barquinha, P ; Pereira, L ; Ferreira, I ; Fortunato, E ;
PUBLICAÇÃO: 2007, FONTE: APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, VOLUME: 89, NÚMERO: 1

INDEXADO EM:

Scopus

WOS

CrossRef

NO MEU:

ORCID |

ResearcherID

164

TÃTULO: Role of order and disorder on the electronic performances of oxide semiconductor thin film transistors Full Text
AUTORES: Martins, R ; Barquinha, P ; Ferreira, I ; Pereira, L ; Goncalves, G; Fortunato, E ;
PUBLICAÇÃO: 2007, FONTE: JOURNAL OF APPLIED PHYSICS, VOLUME: 101, NÚMERO: 4

INDEXADO EM:

Scopus

WOS

CrossRef

NO MEU:

ORCID |

ResearcherID

165

TÃTULO: Role of the oxide layer on the performances of a-Si : H schottky structures applied to PDS fabrication
AUTORES: Hugo Aguas ; Luis Pereira ; Daniel Costa; Leandro Raniero; Elvira Fortunato ; Rodrigo Martins ;
PUBLICAÇÃO: 2007, FONTE: Symposium on Amorphous and Polycrystalline Thin-Film Silicon Science and Technology held at the 2006 MRS Spring Meeting in Amorphous and Polycrystalline Thin-Film Silicon Science and Technology 2006, VOLUME: 910

INDEXADO EM:

Scopus

WOS

NO MEU:

ORCID |

ResearcherID

166

TÃTULO: A next generation TCO material for display systems: Molybdenum doped indium oxide thin films
AUTORES: Elangovan, E; Marques, A; Martins, R ; Fortunato, E ;
PUBLICAÇÃO: 2006, FONTE: 2006 MRS Spring Meeting in Materials Research Society Symposium Proceedings, VOLUME: 936

INDEXADO EM:

Scopus

NO MEU:

ORCID

167

TÃTULO: A study on the electrical properties of ZnO based transparent TFTs
AUTORES: Barquinha, P ; Fortunato, E ; Goncalves, A; Pimentel, A ; Marques, A; Pereira, L ; Martins, R ;
PUBLICAÇÃO: 2006, FONTE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, NÚMERO: PART 1

INDEXADO EM:

Scopus

WOS

CrossRef: 5

NO MEU:

ORCID

168

TÃTULO: Amorphous silicon position sensitive detectors applied to micropositioning Full Text
AUTORES: Contreras, J; Baptista, C; Ferreira, I ; Costa, D; Pereira, S; Aguas, H ; Fortunato, E ; Martins, R ; Wierzbicki, R; Heerlein, H;
PUBLICAÇÃO: 2006, FONTE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, NÚMERO: 9-20

INDEXADO EM:

Scopus

WOS

CrossRef

NO MEU:

ORCID |

ResearcherID

169

TÃTULO: Characterization of nanocrystalline silicon carbide films Full Text
AUTORES: Zhang, S; Pereira, L ; Hu, Z; Ranieiro, L; Fortonato, E; Ferreira, I ; Martins, R ;
PUBLICAÇÃO: 2006, FONTE: 21st International Conference on Amorphous and Nanocrystalline Semiconductors in JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 352, NÚMERO: 9-20

INDEXADO EM:

Scopus

WOS

CrossRef

NO MEU:

ORCID |

ResearcherID

170