51
TÍTULO: Study of environmental degradation of silver surface
AUTORES: Aguas, H ; Silva, RJC ; Viegas, M; Pereira, L ; Fortunato, E ; Martins, R ;
PUBLICAÇÃO: 2008, FONTE: 4th International Conference on Spectroscopic Ellipsometry (ICSE-4) in PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 5, NO 5, VOLUME: 5, NÚMERO: 5
INDEXADO EM: Scopus WOS
52
TÍTULO: Study of graded Ni-Ti shape memory alloy film growth on Si(100) substrate  Full Text
AUTORES: Martins, RMS ; Schell, N; Muecklich, A; Reuther, H; Beckers, M; Silva, RJC ; Pereira, L ; Braz M B Fernandes ;
PUBLICAÇÃO: 2008, FONTE: APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, VOLUME: 91, NÚMERO: 2
INDEXADO EM: Scopus WOS CrossRef
53
TÍTULO: Texture development in Ni-Ti thin films
AUTORES: Braz Fernandes, FM ; Martins, RMS ; Schell, N; Mahesh, KK; Silva, RJC ;
PUBLICAÇÃO: 2008, FONTE: 3rd International Conference on Smart Materials, Structures and Systems - State-of-the-art Research and Application of SMAs Technologies, CIMTEC 2008 in CIMTEC 2008 - Proceedings of the 3rd International Conference on Smart Materials, Structures and Systems - State-of-the-art Research and Application of SMAs Technologies, VOLUME: 59
INDEXADO EM: Scopus
NO MEU: ORCID
54
TÍTULO: The Interfacial Diffusion Zone in Magnetron Sputtered Ni-Ti Thin Films Deposited on Different Si Substrates Studied by HR-TEM
AUTORES: Martins, RMS ; Beckers, M; Muecklich, A; Schell, N; Silva, RJC ; Mahesh, KK; Fernandes, FMB ;
PUBLICAÇÃO: 2008, FONTE: 13th Conference of the Sociedade-Portuguesa-de-Materiais/4th International Materials Symposium in ADVANCED MATERIALS FORUM IV, VOLUME: 587-588
INDEXADO EM: Scopus WOS CrossRef: 3
NO MEU: ORCID
55
TÍTULO: In-situ study of Ni-Ti thin film growth on a TiN intermediate layer by X-ray diffraction  Full Text
AUTORES: Martins, RMS ; Schell, N; Silva, RJC ; Pereira, L ; Mahesh, KK; Braz Fernandes, FMB ;
PUBLICAÇÃO: 2007, FONTE: Symposium on Functional Materials for Micro and Nanosystems in SENSORS AND ACTUATORS B-CHEMICAL, VOLUME: 126, NÚMERO: 1
INDEXADO EM: Scopus WOS
56
TÍTULO: Sol gel porous ZnO thin films for gas sensing applications
AUTORES: Musat, V; Fortunato, E ; Braz B Fernandes; Jorge Cordetro C Silva ;
PUBLICAÇÃO: 2007, FONTE: 5th International Romanian Conference on Advanced Materials in JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, VOLUME: 9, NÚMERO: 5
INDEXADO EM: Scopus WOS
57
TÍTULO: Growth of sputter-deposited Ni-Ti thin films: Effect of a SiO2 buffer layer  Full Text
AUTORES: Martins, RMS ; Schell, N; Beckers, M; Mahesh, KK; Silva, RJC ; Fernandes, FMB ;
PUBLICAÇÃO: 2006, FONTE: APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, VOLUME: 84, NÚMERO: 3
INDEXADO EM: Scopus WOS CrossRef
58
TÍTULO: In-situ observation of Ni-Ti thin film growth by synchrotron radiation scattering
AUTORES: Martins, RMS ; Fernandes, FMB ; Silva, RJC ; Beckers, M; Schell, N;
PUBLICAÇÃO: 2006, FONTE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, NÚMERO: PART 2
INDEXADO EM: Scopus WOS
59
TÍTULO: Study of the textural evolution in Ti-rich NiTi using synchrotron radiation  Full Text
AUTORES: Paula, AS; Canejo, JHP; Mahesh, KK; Silva, RJC ; Fernandes, FMB ; Martins, RMS ; Cardoso, AMA; Schell, N;
PUBLICAÇÃO: 2006, FONTE: Symposium on Synchrotron Radiation and Materials Science held at the 2005 Spring Meeting of the European-Materials-Research-Society in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 246, NÚMERO: 1
INDEXADO EM: Scopus WOS CrossRef
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TÍTULO: Thermal cycling treatment and structural changes in Cu-Al-Ni monocrystalline alloys
AUTORES: Silva, RJ ; Matlakhova, LA; Pereira, EC; Matlakhov, AN; Monteiro, SN; Rodriguez, RJS;
PUBLICAÇÃO: 2006, FONTE: 3rd International Materials Symposium/12th Meeting of the Sociedad-Portuguesa-da-Materials (Materials 2005/SPM) in ADVANCED MATERIALS FORUM III, PTS 1 AND 2, VOLUME: 514-516, NÚMERO: PART 1
INDEXADO EM: Scopus WOS CrossRef: 10
NO MEU: ORCID
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