ProfileOfResearchers

TÃTULO: Influence of the deposition parameters on the growth of SiGe nanocrystals embedded in Al2O3 matrix
AUTORES: Vieira, EMF; Pinto, SRC; Levichev, S ; Rolo, AG ; Chahboun, A ; Buljan, M; Barradas, NP ; Alves, E ; Bernstorff, S; Conde, O ; Gomes, MJM ;
PUBLICAÇÃO: 2011, FONTE: EMRS 2010 Spring Meeting on Post-Si-CMOS Electronic Devices - The Role of Ge and III-V Materials in MICROELECTRONIC ENGINEERING, VOLUME: 88, NÚMERO: 4

INDEXADO EM:

Scopus

WOS

Handle

TÃTULO: Growth and characterization of Mn-doped ZnO/TiO2 multilayer nanostructures grown by pulsed laser deposition Full Text
AUTORES: Khodorov, A ; Levichev, S ; Chahboun, A ; Rolo, AG ; Bernstorff, S; Barradas, NP ; Alves, E ; Gomes, MJM ;
PUBLICAÇÃO: 2010, FONTE: 10th International Conference on Trends in Nanotechnology (TNT) in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7, NO 11-12, VOLUME: 7, NÚMERO: 11-12

INDEXADO EM:

Scopus

WOS

TÃTULO: Mn-doped ZnO nanocrystals embedded in Al2O3: structural and electrical properties
AUTORES: Khodorov, A ; Levichev, S ; Rolo, AG ; Karzazi, O; Chahboun, A ; Novak, J; Vorobiev, A; Tavares, CJ ; Eyidi, D; Riviere, JP; Beaufort, MF; Barradas, NP ; Alves, E ; Barber, DJ; Lanceros Mendez, S ; Gomes, MJM ;
PUBLICAÇÃO: 2010, FONTE: NANOTECHNOLOGY, VOLUME: 21, NÚMERO: 50

INDEXADO EM:

Scopus

WOS

Handle

TÃTULO: Structural and charge trapping properties of two bilayer (Ge+SiO2)/SiO2 films deposited on rippled substrate Full Text
AUTORES: Buljan, M; Grenzer, J; Holy, V; Radic, N; Misic Radic, T; Levichev, S ; Bernstorff, S; Pivac, B; Capan, I;
PUBLICAÇÃO: 2010, FONTE: APPLIED PHYSICS LETTERS, VOLUME: 97, NÚMERO: 16

INDEXADO EM:

Scopus

WOS

TÃTULO: Study of the substitution effect of Mn doped in ZnO matrix
AUTORES: Karzazi, O; Chahboun, A ; Rolo, AG; Hlil, EK; Benzakour, N; Bouslykhane, K; Hourmatallah, A; Levichev, S ; Khodorov, A; Gomes, MJM ;
PUBLICAÇÃO: 2010, FONTE: EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, VOLUME: 50, NÚMERO: 3

INDEXADO EM:

Scopus

WOS

Handle