ProfileOfResearchers

TÃTULO: Property change in ZrNxOy thin films: effect of the oxygen fraction and bias voltage Full Text
AUTORES: Vaz, F ; Carvalho, P; Cunha, L ; Rebouta, L ; Moura, C ; Alves, E ; Ramos, AR ; Cavaleiro, A ; Goudeau, P; Riviere, JP;
PUBLICAÇÃO: 2004, FONTE: 31st International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 469, NÚMERO: SPEC. ISS.

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TÃTULO: Raman analysis of Si-C-N films grown by reactive magnetron sputtering Full Text
AUTORES: Liang, EJ; Zhang, JW; Leme, J; Moura, C ; Cunha, L ;
PUBLICAÇÃO: 2004, FONTE: 31st International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 469, NÚMERO: SPEC. ISS.

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TÃTULO: Effect of nitrogen gas flow on amorphous Si-C-N films produced by PVD techniques Full Text
AUTORES: Moura, C ; Cunha, L ; Orfao, H; Pischow, K; De Rijk, J; Rybinski, M; Mrzyk, D;
PUBLICAÇÃO: 2003, FONTE: 8th International Conference on Plasma Surface Engineering in SURFACE & COATINGS TECHNOLOGY, VOLUME: 174

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TÃTULO: Characterisation of chromium nitride films produced by PVD techniques Full Text
AUTORES: Barata, A; Cunha, L ; Moura, C ;
PUBLICAÇÃO: 2001, FONTE: 28th International Conference on Metallurgical Coatings and Thin Films in THIN SOLID FILMS, VOLUME: 398

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TÃTULO: Density of vibrational states in highly disordered systems through Raman scattering and atomic-scale simulation Full Text
AUTORES: Carles, R; Zwick, A; Moura, C ; Djafari Rouhani, M;
PUBLICAÇÃO: 1998, FONTE: 6th International Workshop on Disordered Systems in PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, VOLUME: 77, NÚMERO: 2

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