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362

TÃTULO: Materials research under ITER-like divertor conditions at FOM Rijnhuizen Full Text
AUTORES: Wright, GM; Westerhout, J; Al, RS; Alves, E ; Alves, LC ; Barradas, NP ; van den Berg, MA; Borodin, D; Brezinsek, S; Brons, S; van Eck, HJN; de Groot, B; Kleyn, AW; Koppers, WR; Kruijt, OG; Linke, J; Lopes J L Cardozo; Mayer, M; van der Meiden, HJ; Prins, PR; van Rooij, GJ; Scholten, J; Shumack, AE; Smeets, PHM; De Temmerman, G; Vijvers, WAJ; Rapp, J; ...Mais
PUBLICAÇÃO: 2011, FONTE: 14th International Conference on Fusion Reactor Materials (ICFRM) in JOURNAL OF NUCLEAR MATERIALS, VOLUME: 417, NÚMERO: 1-3

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363

TÃTULO: Mechanisms of damage formation in Eu-implanted GaN probed by X-ray diffraction
AUTORES: Lacroix, B; Leclerc, S; Declemy, A; Lorenz, K ; Alves, E ; Ruterana, P;
PUBLICAÇÃO: 2011, FONTE: EPL, VOLUME: 96, NÚMERO: 4

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364

TÃTULO: Microstructural characterization of the ODS Eurofer 97 EU-batch Full Text
AUTORES: Mateus, R ; Carvalho, PA ; Nunes, D ; Alves, LC ; Franco, N; Correia, JB; Alves, E ;
PUBLICAÇÃO: 2011, FONTE: 26th Symposium on Fusion Technology (SOFT) in FUSION ENGINEERING AND DESIGN, VOLUME: 86, NÚMERO: 9-11

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365

TÃTULO: Optical properties of AlNxOy thin films deposited by DC magnetron sputtering
AUTORES: Borges, J ; Alves, E ; Vaz, F ; Marques, L ;
PUBLICAÇÃO: 2011, FONTE: International Conference on Applications of Optics and Photonics in INTERNATIONAL CONFERENCE ON APPLICATIONS OF OPTICS AND PHOTONICS, VOLUME: 8001

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366

TÃTULO: Optimization Of A Mass Spectrometry Process
AUTORES: Jose Lopes ; Correa Alegria, FC ; Luis Redondo ; Barradas, NP ; Alves, E ; Jorge Rocha;
PUBLICAÇÃO: 2011, FONTE: 21st International Conference on Application of Accelerators in Research and Industry (CAARI) in APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: TWENTY-FIRST INTERNATIONAL CONFERENCE, VOLUME: 1336

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367

TÃTULO: Optimization Of A Mass Spectrometry Process
AUTORES: José Lopes ; Corre^a C Alegria; Luís Redondo ; Barradas, NP ; Alves, E ; Jorge Rocha; Floyd D McDaniel; Barney L Doyle;
PUBLICAÇÃO: 2011

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368

TÃTULO: Preparation and characterization of CrNxOy thin films: The effect of composition and structural features on the electrical behavior Full Text
AUTORES: Arvinte, R; Borges, J ; Sousa, RE; Munteanu, D; Barradas, NP ; Alves, E ; Vaz, F ; Marques, L ;
PUBLICAÇÃO: 2011, FONTE: APPLIED SURFACE SCIENCE, VOLUME: 257, NÚMERO: 21

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369

TÃTULO: Radiation damage formation and annealing in GaN and ZnO
AUTORES: Lorenz, K ; Peres, M; Franco, N; Marques, JG ; Miranda, SMC; Magalhaes, S; Monteiro, T ; Wesch, W; Alves, E ; Wendler, E;
PUBLICAÇÃO: 2011, FONTE: Conference on Oxide-based Materials and Devices II in OXIDE-BASED MATERIALS AND DEVICES II, VOLUME: 7940

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370

TÃTULO: Rapid thermal annealing of rare earth implanted ZnO epitaxial layers Full Text
AUTORES: Miranda, SMC; Peres, M; Monteiro, T ; Alves, E ; Sun, HD; Geruschke, T; Vianden, R; Lorenz, K ;
PUBLICAÇÃO: 2011, FONTE: Spring Meeting of the European-Materials-Research-Society in OPTICAL MATERIALS, VOLUME: 33, NÚMERO: 7

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