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432

TÃTULO: Stopping power of B-11 in Si and TiO2 measured with a bulk sample method and Bayesian inference data analysis Full Text
AUTORES: Siketic, Z; Bogdanovic B Radovic; Alves, E ; Barradas, NP ;
PUBLICAÇÃO: 2010, FONTE: 19th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 268, NÚMERO: 11-12

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433

TÃTULO: Strain dependence electrical resistance and cohesive strength of ITO thin films deposited on electroactive polymer Full Text
AUTORES: Rebouta, L ; Rubio Pena, L; Oliveira, C; Lanceros Mendez, S ; Tavares, CJ ; Alves, E ;
PUBLICAÇÃO: 2010, FONTE: Symposium on Synthesis, Processing and Characterization of Nanoscale Multi Functional Oxide Films II held at the 2009 Spring EMRS Meeting in THIN SOLID FILMS, VOLUME: 518, NÚMERO: 16

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434

TÃTULO: Structural and thermal characterization of SiO2-P2O5 sol-gel powders upon annealing at high temperatures Full Text
AUTORES: Elisa, M; Sava, BA; Volceanov, A; Monteiro, RCC ; Alves, E ; Franco, N; Costa A C Oliveira; Fernandes, H ; Ferro, MC;
PUBLICAÇÃO: 2010, FONTE: JOURNAL OF NON-CRYSTALLINE SOLIDS, VOLUME: 356, NÚMERO: 9-10

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435

TÃTULO: Structural anisotropy of nonpolar and semipolar InN epitaxial layers Full Text
AUTORES: Darakchieva, V; Y Xie; Franco, N; Giuliani, F; Nunes, B; Alves, E ; Hsiao, CL; Chen, LC; Yamaguchi, T; Takagi, Y; Kawashima, K; Nanishi, Y;
PUBLICAÇÃO: 2010, FONTE: JOURNAL OF APPLIED PHYSICS, VOLUME: 108, NÚMERO: 7

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436

TÃTULO: Structural study of Si1-xGex nanocrystals embedded in SiO2 films
AUTORES: Pinto, SRC; Kashtiban, RJ; Rolo, AG ; Buljan, M; Chahboun, A ; Bangert, U; Barradas, NP ; Alves, E ; Gomes, MJM ;
PUBLICAÇÃO: 2010, FONTE: Symposium on Silicon and Germanium Issues for Future CMOS Devices held at the 2009 E-MRS Spring Meeting in THIN SOLID FILMS, VOLUME: 518, NÚMERO: 9

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437

TÃTULO: The Characterization of N Interstitials and Dangling Bond Point Defects on Ion-Implanted GaN Nanowires Studied by Photoluminescence and X-Ray Absorption Spectroscopy. Rapid Communications of the American Ceramic Society Full Text
AUTORES: Kuo Hao Lee; Jau Wern Chiou; Jin Ming Chen; Jyh Fu Lee; Alain Braud; Katharina Lorenz ; Eduardo Alves ; In Gann Chen;
PUBLICAÇÃO: 2010, FONTE: JOURNAL OF THE AMERICAN CERAMIC SOCIETY, VOLUME: 93, NÚMERO: 11

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438

TÃTULO: Total reflectance and Raman studies in AlyInxGa1-x-yN epitaxial layers Full Text
AUTORES: Margarida M Bola; Correia, MR ; Pereira, S ; Gonzalez, JC; Lorenz, K ; Alves, E ; Barradas, N ;
PUBLICAÇÃO: 2010, FONTE: Symposium on Group III Nitride Semiconductors held at the 2009 EMRS Spring Meeting in PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7, NO 1, VOLUME: 7, NÚMERO: 1

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