491
TÍTULO: ZnO Thin Films Implanted with Al, Sb and P: Optical, Structural and Electrical Characterization
AUTORES: Viseu, T ; de Campos, JA; Rolo, AG ; de Lacerda Aroso, T ; Cerqueira, MF ; Alves, E ;
PUBLICAÇÃO: 2009, FONTE: JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, VOLUME: 9, NÚMERO: 6
INDEXADO EM: Scopus WOS CrossRef Handle
492
TÍTULO: ZrOxNy decorative thin films prepared by the reactive gas pulsing process  Full Text
AUTORES: Pedro Carvalho; Luis Cunha ; Eduardo Alves ; Nicolas Martin; Eric Le Bourhis; Filipe Vaz ;
PUBLICAÇÃO: 2009, FONTE: JOURNAL OF PHYSICS D-APPLIED PHYSICS, VOLUME: 42, NÚMERO: 19
INDEXADO EM: Scopus WOS CrossRef
493
TÍTULO: A comparative investigation of the damage build-up in GaN and Si during rare earth ion implantation  Full Text
AUTORES: Florence Gloux; Pierre Ruterana; Lorenz, K ; Alves, E ;
PUBLICAÇÃO: 2008, FONTE: 2nd Workshop on Impurity Based Electroluminescent Devices and Materials (IBEDM 2006) in PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, VOLUME: 205, NÚMERO: 1
INDEXADO EM: Scopus WOS CrossRef
494
TÍTULO: A comparative structural investigation of GaN implanted with rare earth ions at room temperature and 500 degrees C  Full Text
AUTORES: Gloux, F; Ruterana, P; Lorenz, K ; Alves, E ;
PUBLICAÇÃO: 2008, FONTE: Meeting of the European-Materials-Research-Society in MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, VOLUME: 146, NÚMERO: 1-3
INDEXADO EM: Scopus WOS CrossRef
495
TÍTULO: Anisotropy effects on the formation of new phases in alpha-Al2O3 by high fluence Zn implantation  Full Text
AUTORES: Marques, C; Franco, N; da Silva, RC; McHargue, C; Alves, E ;
PUBLICAÇÃO: 2008, FONTE: 14th International Conference on Radiation Effects in Insulators (REI-14) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 266, NÚMERO: 12-13
INDEXADO EM: Scopus WOS CrossRef
496
TÍTULO: Charging effects in CdSe nanocrystals embedded in SiO2 matrix produced by rf magnetron sputtering
AUTORES: Levichev, S ; Chahboun, A ; Basa, P; Rolo, AG ; Barradas, NP ; Alves, E ; Horvath, ZJ; Conde, O ; Gomes, MJM ;
PUBLICAÇÃO: 2008, FONTE: Symposium on Materials and Emerging Technologies for Non-Volatile-Memory Devices held at the 2008 EMRS Spring Meeting in MICROELECTRONIC ENGINEERING, VOLUME: 85, NÚMERO: 12
INDEXADO EM: Scopus WOS CrossRef Handle
498
TÍTULO: Comparison of ZnO thin films grown by pulsed laser deposition on sapphire and Si substrates  Full Text
AUTORES: Han, L; Mei, F; Liu, C; Pedro, C; Alves, E ;
PUBLICAÇÃO: 2008, FONTE: PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, VOLUME: 40, NÚMERO: 3
INDEXADO EM: Scopus WOS CrossRef
499
TÍTULO: Defect studies on fast and thermal neutron irradiated GaN  Full Text
AUTORES: Lorenz, K ; Marques, JG ; Franco, N; Alves, E ; Peres, M; Correia, MR ; Monteiro, T ;
PUBLICAÇÃO: 2008, FONTE: 14th International Conference on Radiation Effects in Insulators (REI-14) in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 266, NÚMERO: 12-13
INDEXADO EM: Scopus WOS CrossRef Handle
500
TÍTULO: Determination of non-Rutherford cross-sections from simple RBS spectra using Bayesian inference data analysis  Full Text
AUTORES: Barradas, NP ; Ramos, AR ; Alves, E ;
PUBLICAÇÃO: 2008, FONTE: 18th International Conference on Ion Beam Analysis in NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, VOLUME: 266, NÚMERO: 8
INDEXADO EM: Scopus WOS CrossRef
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