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TÍTULO: Evolution of the mechanical properties of Ti-based intermetallic thin films doped with different metals to be used as biomedical devices  Full Text
AUTORES: Lopes, C; Gabor, C; Cristea, D; Costa, R; Domingues, RP; Rodrigues, MS; Borges, J ; Alves, E ; Barradas, NP ; Munteanu, D; Vaz, F ;
PUBLICAÇÃO: 2020, FONTE: 11th International Conference on Materials Science and Engineering (BraMat) in APPLIED SURFACE SCIENCE, VOLUME: 505
INDEXADO EM: Scopus WOS CrossRef: 25
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TÍTULO: Fuel inventory and material migration of JET main chamber plasma facing components compared over three operational periods
AUTORES: Widdowson, A; Aleiferis, S; Alves, E ; Avotina, L; Baron Wiechec, A; Catarino, N; Coad, JP; Corregidor, V; Heinola, K; Jepu, I; Makepeace, C;
PUBLICAÇÃO: 2020, FONTE: 17th International Conference on Plasma-Facing Materials and Components for Fusion Applications, PFMC 2019 in PHYSICA SCRIPTA, VOLUME: T171, NÚMERO: 1
INDEXADO EM: Scopus WOS CrossRef: 20
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TÍTULO: Ion beam analysis of fusion plasma-facing materials and components: facilities and research challenges  Full Text
AUTORES: Mayer, M; Moller, S; Rubel, M; Widdowson, A; Charisopoulos, S; Ahlgren, T; Alves, E ; Apostolopoulos, G; Barradas, NP ; Donnelly, S; Fazinic, S; Heinola, K; Kakuee, O; Khodja, H; Kimura, A; Lagoyannis, A; Li, M; Markelj, S; Mudrinic, M; Petersson, P; Portnykh, I; Primetzhofer, D; Reichart, P; Ridikas, D; Silva, T; de Vicente, SMG; Wang, YQ; ...Mais
PUBLICAÇÃO: 2020, FONTE: NUCLEAR FUSION, VOLUME: 60, NÚMERO: 2
INDEXADO EM: Scopus WOS CrossRef: 62
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TÍTULO: Ion beam induced current analysis in GaN microwires  Full Text
AUTORES: Dirkjan Verheij; Marco Peres; Susana Cardoso ; Luís Cerqueira Alves; Eduardo Alves ; Cristophe Durand; Joël Eymery; Jorge Fernandes; Katharina Lorenz ;
PUBLICAÇÃO: 2020, FONTE: EPJ Web of Conferences, VOLUME: 233
INDEXADO EM: CrossRef: 1 Handle
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TÍTULO: Nanocomposite Au-ZnO thin films: Influence of gold concentration and thermal annealing on the microstructure and plasmonic response  Full Text
AUTORES: Pereira Silva, P; Borges, J ; Rodrigues, MS; Oliveira, JC; Alves, E ; Barradas, NP ; Dias, JP; Cavaleiro, A ; Vaz, F ;
PUBLICAÇÃO: 2020, FONTE: SURFACE & COATINGS TECHNOLOGY, VOLUME: 385
INDEXADO EM: Scopus WOS CrossRef: 9
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TÍTULO: Nanostructured c-Si surfaces obtained by sequential ion implantation of C+ and Ti+: Tribophysical and structural characterization  Full Text
AUTORES: Nunes, B; Nolasco, P; Serro, AP ; Alves, E ; Colaço, R ;
PUBLICAÇÃO: 2020, FONTE: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, VOLUME: 471
INDEXADO EM: Scopus CrossRef
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TÍTULO: Oxidation behaviour of neutron irradiated Be pebbles
AUTORES: Catarino, N; Alves, LC; Dias, M; Barradas, NP ; van Til, S; Zmitko, M; Alves, E ;
PUBLICAÇÃO: 2020, FONTE: NUCLEAR MATERIALS AND ENERGY, VOLUME: 23
INDEXADO EM: Scopus WOS CrossRef: 2
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TÍTULO: Post-mortem analysis of tungsten plasma facing components in tokamaks: Raman microscopy measurements on compact, porous oxide and nitride films and nanoparticles  Full Text
AUTORES: Pardanaud, C; Dellasega, D; Passoni, M; Martin, C; Roubin, P; Addab, Y; Arnas, C; Couedel, L; Minissale, M; Salomon, E; Giacometti, G; Merlen, A; Bernard, E; Mateus, R; Alves, E ; Siketic, Z; Radovic, IB; Hakola, A;
PUBLICAÇÃO: 2020, FONTE: NUCLEAR FUSION, VOLUME: 60, NÚMERO: 8
INDEXADO EM: Scopus WOS CrossRef: 12
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TÍTULO: Stopping power of hydrogen in hafnium and the importance of relativistic 4f electrons
AUTORES: Montanari, CC; Miranda, PA; Alves, E ; Mendez, AMP; Mitnik, DM; Miraglia, JE; Correa, R; Wachter, J; Aguilera, M; Catarino, N; da Silva, RC;
PUBLICAÇÃO: 2020, FONTE: PHYSICAL REVIEW A, VOLUME: 101, NÚMERO: 6
INDEXADO EM: Scopus WOS CrossRef: 10
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TÍTULO: Study of structural and optical properties of MBE grown nonpolar (10-10) ZnO/ZnMgO photonic structures  Full Text
AUTORES: Stachowicz, M; Sajkowski, JM; Kryvyi, S; Pieniazek, A; Reszka, A; Wierzbicka, A; Pietrzyk, MA; Przezdziecka, E; Jarosz, D; Gwozdz, K; Placzek Popko, E; Alves, E ; Magalhaes, S; Kozanecki, A;
PUBLICAÇÃO: 2020, FONTE: OPTICAL MATERIALS, VOLUME: 100
INDEXADO EM: Scopus WOS CrossRef: 8
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